“Scanning microwave imaging of optically patterned Ge2Sb2Te5,” S. R. Johnston, E. Ng, S. W. Fong, W. Y. Mok, J. Park, P. Zalden, A. Sakdinawat, H.-S. P. Wong, H. Mabuchi and Z.-X. Shen, Appl. Phys. Lett. 114, 093106 (2019).
critical foundations for analysis, modeling and design
“Scanning microwave imaging of optically patterned Ge2Sb2Te5,” S. R. Johnston, E. Ng, S. W. Fong, W. Y. Mok, J. Park, P. Zalden, A. Sakdinawat, H.-S. P. Wong, H. Mabuchi and Z.-X. Shen, Appl. Phys. Lett. 114, 093106 (2019).